#[repr(C)]pub struct PhysicalDeviceSampleLocationsPropertiesEXT {
pub s_type: StructureType,
pub p_next: *mut c_void,
pub sample_location_sample_counts: SampleCountFlags,
pub max_sample_location_grid_size: Extent2D,
pub sample_location_coordinate_range: [f32; 2],
pub sample_location_sub_pixel_bits: u32,
pub variable_sample_locations: Bool32,
}
Expand description
Fields§
§s_type: StructureType
§p_next: *mut c_void
§sample_location_sample_counts: SampleCountFlags
§max_sample_location_grid_size: Extent2D
§sample_location_coordinate_range: [f32; 2]
§sample_location_sub_pixel_bits: u32
§variable_sample_locations: Bool32
Implementations§
Trait Implementations§
source§impl Clone for PhysicalDeviceSampleLocationsPropertiesEXT
impl Clone for PhysicalDeviceSampleLocationsPropertiesEXT
source§fn clone(&self) -> PhysicalDeviceSampleLocationsPropertiesEXT
fn clone(&self) -> PhysicalDeviceSampleLocationsPropertiesEXT
Returns a copy of the value. Read more
1.0.0 · source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source
. Read moresource§impl TaggedStructure for PhysicalDeviceSampleLocationsPropertiesEXT
impl TaggedStructure for PhysicalDeviceSampleLocationsPropertiesEXT
const STRUCTURE_TYPE: StructureType = StructureType::PHYSICAL_DEVICE_SAMPLE_LOCATIONS_PROPERTIES_EXT
impl Copy for PhysicalDeviceSampleLocationsPropertiesEXT
impl ExtendsPhysicalDeviceProperties2 for PhysicalDeviceSampleLocationsPropertiesEXT
Auto Trait Implementations§
impl RefUnwindSafe for PhysicalDeviceSampleLocationsPropertiesEXT
impl !Send for PhysicalDeviceSampleLocationsPropertiesEXT
impl !Sync for PhysicalDeviceSampleLocationsPropertiesEXT
impl Unpin for PhysicalDeviceSampleLocationsPropertiesEXT
impl UnwindSafe for PhysicalDeviceSampleLocationsPropertiesEXT
Blanket Implementations§
source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more